Author: Santillana, Mauricio; Tuite, Ashleigh; Nasserie, Tahmina; Fine, Paul; Champredon, David; Chindelevitch, Leonid; Dushoff, Jonathan; Fisman, David
Title: Relatedness of the incidence decay with exponential adjustment (IDEA) model, “Farr's law” and SIR compartmental difference equation models Document date: 2018_3_9
ID: tmt8vdzj_16
Snippet: Difference equation susceptible-infectious-removed model.....
Document: Difference equation susceptible-infectious-removed model
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