Author: Santillana, Mauricio; Tuite, Ashleigh; Nasserie, Tahmina; Fine, Paul; Champredon, David; Chindelevitch, Leonid; Dushoff, Jonathan; Fisman, David
Title: Relatedness of the incidence decay with exponential adjustment (IDEA) model, “Farr's law” and SIR compartmental difference equation models Document date: 2018_3_9
ID: tmt8vdzj_26
Snippet: We need to show both, (A) that the IDEA model satisfies Farr's Law, and (B) that Farr's Law can be derived from the IDEA model. This equivalence requires the intuitive assumption that t in Farr's Law (the subsequent times at which observations are made) are integer values and coincide with the serial (or generation) time interval in the IDEA model......
Document: We need to show both, (A) that the IDEA model satisfies Farr's Law, and (B) that Farr's Law can be derived from the IDEA model. This equivalence requires the intuitive assumption that t in Farr's Law (the subsequent times at which observations are made) are integer values and coincide with the serial (or generation) time interval in the IDEA model.
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