Author: Santillana, Mauricio; Tuite, Ashleigh; Nasserie, Tahmina; Fine, Paul; Champredon, David; Chindelevitch, Leonid; Dushoff, Jonathan; Fisman, David
Title: Relatedness of the incidence decay with exponential adjustment (IDEA) model, “Farr's law” and SIR compartmental difference equation models Document date: 2018_3_9
ID: tmt8vdzj_35
Snippet: The relationship between Farr's law, the IDEA model, and the damped SIR model is illustrated graphically in (Fig. 2) ......
Document: The relationship between Farr's law, the IDEA model, and the damped SIR model is illustrated graphically in (Fig. 2) .
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