Author: Santillana, Mauricio; Tuite, Ashleigh; Nasserie, Tahmina; Fine, Paul; Champredon, David; Chindelevitch, Leonid; Dushoff, Jonathan; Fisman, David
Title: Relatedness of the incidence decay with exponential adjustment (IDEA) model, “Farr's law” and SIR compartmental difference equation models Document date: 2018_3_9
ID: tmt8vdzj_24
Snippet: Here we fit IDEA to the incidence time series and calculated Farr's K for sequential generation tetrads, and converted K values to the d parameter in IDEA using the relation K ¼ 1 ð1þdÞ 4 described below. Model fits were performed in a Microsoft Excel spreadsheet using the Solver add-in. Data sources used for these analyses are available at http://figshare.com/authors/ Tahmina_Nasserie/686527 (Chikungunya) and https://github.com/cmrivers/ebol.....
Document: Here we fit IDEA to the incidence time series and calculated Farr's K for sequential generation tetrads, and converted K values to the d parameter in IDEA using the relation K ¼ 1 ð1þdÞ 4 described below. Model fits were performed in a Microsoft Excel spreadsheet using the Solver add-in. Data sources used for these analyses are available at http://figshare.com/authors/ Tahmina_Nasserie/686527 (Chikungunya) and https://github.com/cmrivers/ebola (Ebola). The Original Microsoft Excel files have been included as Supplemental Information.
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