Author: Pelz, Philipp M; Brown, Hamish G; Ciston, Jim; Findlay, Scott D; Zhang, Yaqian; Scott, Mary; Ophus, Colin
Title: Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone Cord-id: b4inrqpf Document date: 2020_8_28
ID: b4inrqpf
Snippet: Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrat
Document: Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials.
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